Технические приложения & Случаи

Автоматическое оборудование для четырехстороннего визуального контроля чипов: Полупроводниковые решения

Автоматическое оборудование для четырехстороннего визуального контроля чипов

Semiconductor manufacturing and packaging demand strict defect control, и Автоматическое оборудование для четырехстороннего визуального контроля чипов is a core tool. It checks all four sides of chips simultaneously, solving hidden defect issues that threaten product reliability.

Wafer Dicing Stage: Detecting Post-Dicing Defects

Во-первых, wafer dicing often causes micro-cracks, chipping, or edge burrs on chip sides. The Automatic Chip Four-Side Visual Inspection Equipment uses high-resolution cameras to capture these flaws at the dicing stage.

Более того, it integrates with dicing machines for real-time inspection, triggering alerts immediately when defects are found. This solution prevents defective chips from entering the next process, reducing wafer material waste by 30%.

Chip Packaging: Ensuring Lead & Bump Integrity

During packaging, chip leads (pins) or solder bumps may have deformation, missing parts, or oxidation. The Automatic Chip Four-Side Visual Inspection Equipment inspects these key structures from all four angles.

Кроме того, it supports multi-chip package (MCP) inspection, adapting to complex packaging designs. Engineers use this data to adjust packaging parameters, solving issues like poor solderability that cause assembly failures.

High-Speed Production Lines: Matching Mass Manufacturing Needs

Во-вторых, semiconductor factories run high-speed production lines that require fast inspection. The Automatic Chip Four-Side Visual Inspection Equipment achieves inspection speeds of up to 1200 chips per minute.

Более того, its AI-powered image processing reduces false positives by 45% compared to traditional systems. This solution balances speed and accuracy, meeting the throughput requirements of mass chip production.

Advanced Semiconductor Chips: Adapting to Miniaturization

Miniaturized chips (например, 3nm, 2nm process) have smaller features that are harder to inspect. The Automatic Chip Four-Side Visual Inspection Equipment uses ultra-high-definition (UHD) lenses and multi-spectrum lighting.

Например, it detects sub-micron-level scratches on 3nm chip sides that are invisible to standard equipment. This solution supports the development of advanced semiconductors, ensuring quality in cutting-edge processes.

Контроль качества & Traceability: Meeting Industry Standards

Окончательно, semiconductor manufacturers need traceable quality data to comply with ISO and automotive-grade standards. The Automatic Chip Four-Side Visual Inspection Equipment logs inspection results for each chip.

Its data integration function connects to factory MES systems, creating a complete quality audit trail. This solution solves traceability challenges, helping manufacturers meet strict industry certification requirements.

Основная ценность: Safeguarding Semiconductor Quality & Efficiency

The Automatic Chip Four-Side Visual Inspection Equipment combines 360° inspection capability, high speed, and AI intelligence. It replaces manual inspection, eliminating human error and reducing labor costs.

In semiconductor manufacturing and packaging, it’s not just inspection equipment—it’s a solution that ensures chip reliability, accelerates production, and supports the growth of the global semiconductor industry.

Компания Jetronl Instruments Co., ООО. специализируется в области электронных измерений для 35 годы, покрытие различных потребностей в измерениях во всей цепочке электронной промышленности и обеспечение точной поддержки измерений.

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